DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL–PRF–19500 – Semiconductor Devices, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL–STD–750 – Test Methods For Semiconductor Devices.
MIL–STD–1686 – Electrostatic Discharge Control Program for Protection of Electrical and Electronic
Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive
Devices).
DEPARTMENT OF DEFENSE HANDBOOKS
MIL–HDBK–263 – Electrostatic Discharge Control Handbook for Protection of Electrical and
Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated
Explosive Devices)(Metric).
MIL–HDBK–781 – Military Handbook: Reliability Test Methods, Plans, and Environments for
Engineering Development, Qualification, and Production.
ASME INTERNATIONAL (ASME)
ASME Y14.38 – Abbreviations and Acronyms for Use on Drawings and Related Documents.
ASTM INTERNATIONAL (ASTM)
ASTM F526 – Standard Test Method for Using Calorimeters for Total Dose Measurements in
Pulsed Linear Accelerator or Flash X-ray Machines.
INTERNATIONAL ORGANIZATION FOR STANDARDIZATION (ISO)
ISO 14644–1 – Cleanrooms and Associated Controlled Environments – Part 1: Classification of Air
Cleanliness.
ISO 14644–2 – Cleanrooms and Associated Controlled Environments – Part 2: Specifications for
Testing and Monitoring to Prove Continued Compliance with ISO 14644–1.
JEDEC – SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC)
JEDEC JESD34 – Failure-Mechanism-Driven Reliability Qualification Of Silicon Devices.
JEDEC JESD51–1 – Methodology for the Thermal Measurement of Component Packages (Single
Semiconductor Device).
JEDEC JESD282 – Silicon Rectifier Diodes.
JEDEC JESD531 – Thermal Resistance Test Method for Signal and Regulator Diodes
(Forward Voltage, Switching Method).
Nessun commento:
Posta un commento